Methods of Measurements of Electromagnetic Characterization of Free Space Materials in the X-Band

Abstract The technique of electromagnetic characterization of materials in free space allows for the measurement of constitutive properties without making contact with the material being measured. Characterization methods in Free Space are naturally suited for Electromagnetic Radiation Absorbing Materials (RAM) but are also important in applications where the material sample to be measured does not undergo major interventions. They consist of evaluating a received signal resulting from a free-space transmission through two horn antennas with beam collimating lenses and a Vector Network Analyzer (VNA). The characteristics of the transmitted signal are modified by a material positioned between the transmitting and receiving antennas. This work presents methods for electromagnetic characterization in Free Space, in the frequency range of 8.2 to 12.4 GHz (X-Band), in a semi-anechoic chamber, seeking the development of measurement processes that present results with repeatability and reliability. The measurements were made with standard and electromagnetic radiation absorbing materials. The measurement technique presented 95% of efficiency.