← Volver a resultados
Ficha bibliográfica · Consulta y acceso
Artículo de revista

Multi-Illumination Nail Analysis With Uncertainty-Aware Deep Learning: A Comprehensive Approach to Automated Fungal Detection

Zenab Bosheah et al · IEEE · 2026

Material complementario disponible
Lectura rápida. Revisá los datos básicos del recurso y luego accedé al contenido desde el botón principal. En esta ficha solo se muestra la información necesaria para identificar la obra, citarla y abrirla.
Publicación seriada

3PS-RAN: A Real-Time Framework for Securing the O-RAN RACH Against DDoS Attacks Toward NextG

Esta publicación seriada contiene 172 contenidos relacionados.

Acceso al recurso

Entrá al contenido desde la opción principal o elegí otra fuente disponible.

Acceso principal

Material complementario disponible

El enlace apunta a material asociado, anexos, tablas, datos o página complementaria. No se marca como libro/texto completo.
Abrir material

Resumen

Descripción general del contenido del recurso.

This study presents a comprehensive approach to nail condition classification using multi-illumination imaging and uncertainty-aware deep learning. We developed a diagnostic system capturing nail images under ten lighting conditions (normal and polarized versions of white, UV, red, green, and blue light) and classifying them into three categories: normal, fungal infections, and other pathologies. Our ConvNeXt-based neural network architecture demonstrated exceptional performance for fungal detection, achieving accuracies ranging from 93.63% to 96.31% across the various illumination modes. Multi-illumination analysis revealed distinctive signatures, with white light channels demonstrating highest importance (32–33% of attention weights) and red light showing specific utility for fungal detection (11.1% vs. 5–7% for other conditions). Spatial analysis through Gradient-weighted Class Activation Mapping (Grad-CAM) identified that models focus primarily on nail edges when detecting fungal infections, with quantitative grid analysis showing edge regions contributing approximately 3 times more to classification decisions than central regions. Bayesian ensembles provided reliable uncertainty: predictive entropy discriminates correct vs. incorrect decisions (AUROC 0.9429), with strong calibration for the fungus classifier (Brier 0.040, ECE 0.032). t-SNE visualization demonstrated clear feature space separation, with fungal infections showing the most cohesive clustering corresponding to their distinctive illumination-spatial patterns. These convergent findings support clinical examination optimization: prioritizing nail edges under white light, with supplementary red light for suspected fungal cases, represents a promising strategy for future clinical validation.

Cómo citar

Elegí el formato que necesitás y copiá la referencia al portapapeles.

APA 7

al, Z. B. E. (2026). Multi-Illumination Nail Analysis With Uncertainty-Aware Deep Learning: A Comprehensive Approach to Automated Fungal Detection. https://doi.org/10.1109/ACCESS.2026.3686347

MLA

al, Zenab Bosheah et. "Multi-Illumination Nail Analysis With Uncertainty-Aware Deep Learning: A Comprehensive Approach to Automated Fungal Detection." 2026. https://doi.org/10.1109/ACCESS.2026.3686347.

Chicago

al, Zenab Bosheah et. 2026. "Multi-Illumination Nail Analysis With Uncertainty-Aware Deep Learning: A Comprehensive Approach to Automated Fungal Detection.". https://doi.org/10.1109/ACCESS.2026.3686347.

Harvard

al, Z. B. E. 2026, Multi-Illumination Nail Analysis With Uncertainty-Aware Deep Learning: A Comprehensive Approach to Automated Fungal Detection, IEEE, available at: https://doi.org/10.1109/ACCESS.2026.3686347 [Accessed 28 Jun. 2026].

Compartir e imprimir

Guardá la ficha, copiá su enlace permanente o imprimila como PDF.

Exportar referencia

Si usás un gestor bibliográfico, podés exportar el registro en los formatos más comunes.

Detalles del recurso

Información bibliográfica útil para confirmar que se trata del material correcto.

Título
Multi-Illumination Nail Analysis With Uncertainty-Aware Deep Learning: A Comprehensive Approach to Automated Fungal Detection
Autor / colaboradores
Zenab Bosheah et al
Editorial
IEEE
Año de publicación
2026
ISSN
2169-3536
ISSN
2169-3536
Idioma
eng

Materias

Explorá otros recursos relacionados a partir de estas materias.

Copiado