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Analysis of artificial opals by scanning near field optical microscopy

Barrio, J. et al · American Institute of Physics · 2011

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Herein we present a detailed analysis of the optical response of artificial opal films realized employing a near-field scanning optical microscope in collection and transmission modes. Near-field patterns measured at the rear surface when a plane wave impinges on the front face are presented with the finding that optical intensity maps present a clear correlation with the periodic arrangement of the outer surface. Calculations based on the vector Korringa-Kohn-Rostoker method reproduce the different profiles experimentally observed as well as the response to the polarization of the incident field. These observations constitute the first experimental confirmation of the collective lattice resonances that give rise to the optical response of these three dimensional periodic structures in the high-energy range. © 2011 American Institute of Physics. Fil: Barrio, J.. Universidad Autónoma de Madrid; España Fil: Lozano, G.. Consejo Superior de Investigaciones Científicas; España

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APA 7

Barrio, J. E. A. (2011). Analysis of artificial opals by scanning near field optical microscopy. http://hdl.handle.net/11336/56963

MLA

Barrio, J. et al. "Analysis of artificial opals by scanning near field optical microscopy." 2011. http://hdl.handle.net/11336/56963.

Chicago

Barrio, J. et al. 2011. "Analysis of artificial opals by scanning near field optical microscopy.". http://hdl.handle.net/11336/56963.

Harvard

Barrio, J. E. A. 2011, Analysis of artificial opals by scanning near field optical microscopy, American Institute of Physics, available at: http://hdl.handle.net/11336/56963 [Accessed 8 Aug. 2026].

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Titolo
Analysis of artificial opals by scanning near field optical microscopy
Autore / collaboratori
Barrio, J. et al
Editore
American Institute of Physics
Anno di pubblicazione
2011
ISSN
0021-8979
ISSN
0021-8979
Lingua
Inglés

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