Desarrollo de una metodología de modelado para pruebas de inyección de corriente en el diseño de circuitos integrados automotrices

Over the last 20 years, Bulk Current Injection (BCI) testing has become increasingly critical for assessing the electromagnetic compatibility (EMC) of integrated circuits (ICs) in automotive applications. This PhD thesis introduces a systematic, comprehensive modelling methodology for Bulk Current Injection (BCI) tests, essential for evaluating the EMC of ICs in automotive applications. One of the primary challenges in this research lies in the difficulty of accurately measuring disturbance levels during BCI tests due to significant interference from component and test instrument parasitics. Previous work presented by the author during the PhD demonstrated that subtle changes in measurement components could drastically affect the results. This thesis extends that work by systematically verifying how small changes in the measurement setup influence outcomes, highlighting the complexity of achieving reliable and reproducible results in BCI testing. This thesis includes an extensive analysis of existing models from the State of the Art from the last years. By situating this project within a precise technological context, it leverages recent developments—some published after this PhD research began—thereby establishing the contemporary relevance of the methodology. The core of the thesis encompasses detailed model developments and component modelling efforts, validated individually and as a whole. Following individual component validation, the more complex system assembly was incrementally tested, ultimately demonstrating a robust understanding of the entire test bench and enabling predictions of the so-called “BCI Signature” in a Device Under Test (DUT). This achievement marks a significant advancement, aligning with the final objective: the capability to determine and predict the IC performance during BCI. This methodology was seamlessly integrated into the IC design flow, bridging the gap between EMC testing and IC development processes. Furthermore, this thesis demonstrates the application of the methodology to case studies of technological relevance in the context of Automotive IC design. The insights from this research are immediately applicable to automotive IC designers and system engineers aiming to improve pre-silicon EMC prediction and design optimisation for robustness against BCI-induced interference. The core modelling techniques and general methodology can also be extended to other EMC test scenarios and industries such as avionics or military.