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On-chip optical parity checker using silicon photonic integrated circuits

Liu Zilong et al · Wiley · 2018

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The optical parity checker plays an important role in error detection and correction for high-speed, large-capacity, complex digital optical communication networks, which can be employed to detect and correct the error bits by using a specific coding theory such as introducing error-detecting and correcting codes in communication channels. In this paper, we report an integrated silicon photonic circuit that is capable of implementing the parity checking for binary string with an arbitrary number of bits. The proposed parity checker consisting of parallel cascaded N micro-ring resonators (MRRs) is based on directed logic scheme, which means that the operands applied to MRRs to control the switching states of the MRRs are electrical signals, the operation signals are optical signals, and the final operation results are obtained at the output ports in the form of light. A 3-bit parity checker with an operation speed of 10 kbps, fabricated on a silicon-on-insulator (SOI) platform using a standard commercial complementary metal-oxide-semiconductor (CMOS) process, was experimentally and successfully demonstrated.

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APA 7

al, L. Z. E. (2018). On-chip optical parity checker using silicon photonic integrated circuits. https://doi.org/10.1515/nanoph-2018-0140

MLA

al, Liu Zilong et. "On-chip optical parity checker using silicon photonic integrated circuits." 2018. https://doi.org/10.1515/nanoph-2018-0140.

Chicago

al, Liu Zilong et. 2018. "On-chip optical parity checker using silicon photonic integrated circuits.". https://doi.org/10.1515/nanoph-2018-0140.

Harvard

al, L. Z. E. 2018, On-chip optical parity checker using silicon photonic integrated circuits, Wiley, available at: https://doi.org/10.1515/nanoph-2018-0140 [Accessed 8 Aug. 2026].

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Titolo
On-chip optical parity checker using silicon photonic integrated circuits
Autore / collaboratori
Liu Zilong et al
Editore
Wiley
Anno di pubblicazione
2018
ISSN
2192-8606
ISSN
2192-8606
Lingua
Inglés

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