Torna ai risultati
Scheda bibliografica · Consultazione e accesso
Artículo

Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration

Qilong Guan et al · KeAi Communications Co., Ltd · 2023

Accesso aperto disponibile
Lettura rapida. Controlla i dati essenziali della risorsa e accedi al contenuto con il pulsante principale. La scheda mostra solo le informazioni necessarie per identificare, citare e aprire l’opera.

Accesso alla risorsa

Apri il contenuto dall’opzione principale o scegli un’altra fonte disponibile.

DOAJ DOAJ Articles
Entrar por DOAJ
Accesso principale

Accesso aperto disponibile

Recurso identificado como acceso abierto, sin confirmar automáticamente si es texto completo directo.
Apri risorsa

Riepilogo

Descripción general del contenido del recurso.

Abstract The spacecraft for deep space exploration missions will face extreme environments, including cryogenic temperature, intense radiation, wide-range temperature variations and even the combination of conditions mentioned above. Harsh environments will lead to solder joints degradation or even failure, resulting in damage to onboard electronics. The research activities on high reliability solder joints using in extreme environments can not only reduce the use of onboard protection devices, but effectively improve the overall reliability of spacecraft, which is of great significance to the aviation industry. In this paper, we review the reliability research on SnPb solder alloys, Sn-based lead-free solder alloys and In-based solder alloys in extreme environments, and try to provide some suggestions for the follow-up studies, which focus on solder joint reliability under extreme environments.

Come citare

Elegí el formato que necesitás y copiá la referencia al portapapeles.

APA 7

al, Q. G. E. (2023). Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration. https://doi.org/10.1186/s10033-023-00834-4

MLA

al, Qilong Guan et. "Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration." 2023. https://doi.org/10.1186/s10033-023-00834-4.

Chicago

al, Qilong Guan et. 2023. "Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration.". https://doi.org/10.1186/s10033-023-00834-4.

Harvard

al, Q. G. E. 2023, Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration, KeAi Communications Co, Ltd, available at: https://doi.org/10.1186/s10033-023-00834-4 [Accessed 7 Aug. 2026].

Condividi e stampa

Salva la scheda, copia il link permanente o stampala in PDF.

Esporta riferimento

Esporta il record nei formati più comuni per usarlo con un gestore bibliografico.

Dettagli della risorsa

Informazioni bibliografiche utili per verificare che sia il materiale corretto.

Titolo
Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration
Autore / collaboratori
Qilong Guan et al
Editore
KeAi Communications Co., Ltd
Anno di pubblicazione
2023
ISSN
2192-8258
ISSN
2192-8258
Lingua
Inglés

Soggetti

Esplora risorse correlate a partire da questi soggetti.

Copiato