Ultra-high resolution strain sensor network assisted with an LS-SVM based hysteresis model
Tao Liu et al · Editorial Office of Opto-Electronic Journals Group, Institute of Optics and Electronics, CAS, China · 2021
Accesso alla risorsa
Apri il contenuto dall’opzione principale o scegli un’altra fonte disponibile.
Accesso aperto disponibile
Riepilogo
Descripción general del contenido del recurso.
Come citare
Elegí el formato que necesitás y copiá la referencia al portapapeles.
APA 7
al, T. L. E. (2021). Ultra-high resolution strain sensor network assisted with an LS-SVM based hysteresis model. https://doi.org/10.29026/oea.2021.200037
MLA
al, Tao Liu et. "Ultra-high resolution strain sensor network assisted with an LS-SVM based hysteresis model." 2021. https://doi.org/10.29026/oea.2021.200037.
Chicago
al, Tao Liu et. 2021. "Ultra-high resolution strain sensor network assisted with an LS-SVM based hysteresis model.". https://doi.org/10.29026/oea.2021.200037.
Harvard
al, T. L. E. 2021, Ultra-high resolution strain sensor network assisted with an LS-SVM based hysteresis model, Editorial Office of Opto-Electronic Journals Group, Institute of Optics and Electronics, CAS, China, available at: https://doi.org/10.29026/oea.2021.200037 [Accessed 10 Aug. 2026].
Dettagli della risorsa
Informazioni bibliografiche utili per verificare che sia il materiale corretto.
- Titolo
- Ultra-high resolution strain sensor network assisted with an LS-SVM based hysteresis model
- Autore / collaboratori
- Tao Liu et al
- Editore
- Editorial Office of Opto-Electronic Journals Group, Institute of Optics and Electronics, CAS, China
- Anno di pubblicazione
- 2021
- ISSN
- 2096-4579
- ISSN
- 2096-4579
- Lingua
- Inglés
Soggetti
Esplora risorse correlate a partire da questi soggetti.