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Stress-Induced Deformation of Thin Copper Substrate in Double-Sided Lapping

Jiang Guo et al · KeAi Communications Co., Ltd · 2023

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Abstract Double-sided lapping is an precision machining method capable of obtaining high-precision surface. However, during the lapping process of thin pure copper substrate, the workpiece will be warped due to the influence of residual stress, including the machining stress and initial residual stress, which will deteriorate the flatness of the workpiece and ultimately affect the performance of components. In this study, finite element method (FEM) was adopted to study the effect of residual stress-related on the deformation of pure copper substrate during double-sided lapping. Considering the initial residual stress of the workpiece, the stress caused by the lapping and their distribution characteristics, a prediction model was proposed for simulating workpiece machining deformation in lapping process by measuring the material removal rate of the upper and lower surfaces of the workpiece under the corresponding parameters. The results showed that the primary cause of the warping deformation of the workpiece in the double-sided lapping is the redistribution of initial residual stress caused by uneven material removal on the both surfaces. The finite element simulation results were in good agreement with the experimental results.

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APA 7

al, J. G. E. (2023). Stress-Induced Deformation of Thin Copper Substrate in Double-Sided Lapping. https://doi.org/10.1186/s10033-022-00824-y

MLA

al, Jiang Guo et. "Stress-Induced Deformation of Thin Copper Substrate in Double-Sided Lapping." 2023. https://doi.org/10.1186/s10033-022-00824-y.

Chicago

al, Jiang Guo et. 2023. "Stress-Induced Deformation of Thin Copper Substrate in Double-Sided Lapping.". https://doi.org/10.1186/s10033-022-00824-y.

Harvard

al, J. G. E. 2023, Stress-Induced Deformation of Thin Copper Substrate in Double-Sided Lapping, KeAi Communications Co, Ltd, available at: https://doi.org/10.1186/s10033-022-00824-y [Accessed 9 Aug. 2026].

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Titolo
Stress-Induced Deformation of Thin Copper Substrate in Double-Sided Lapping
Autore / collaboratori
Jiang Guo et al
Editore
KeAi Communications Co., Ltd
Anno di pubblicazione
2023
ISSN
2192-8258
ISSN
2192-8258
Lingua
Inglés

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