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Analysis and research of methods of linearization of the transfer function of precision semiconductor temperature sensors

O. V. Boyko et al · Vasyl Stefanyk Carpathian National University · 2020

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The analysis of the nonlinearity of the transfer function of primary temperature transducers based on transistor structures has been performed. It’s shown that the quadratic component of the transfer function creates a significant nonlinearity error up to 0,2-0,6°C. We have developed methods of linearization based on both the formation of compensatory measuring current and change of the conversion factor of the output scaling amplifier at certain ranges of temperature measurement, which ensure their use in precision temperature measuring devices. The measurement error does not exceed 0.01°C in the range of 30-100°C.

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APA 7

al, O. V. B. E. (2020). Analysis and research of methods of linearization of the transfer function of precision semiconductor temperature sensors. https://doi.org/10.15330/pcss.21.4.737-742

MLA

al, O. V. Boyko et. "Analysis and research of methods of linearization of the transfer function of precision semiconductor temperature sensors." 2020. https://doi.org/10.15330/pcss.21.4.737-742.

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al, O. V. Boyko et. 2020. "Analysis and research of methods of linearization of the transfer function of precision semiconductor temperature sensors.". https://doi.org/10.15330/pcss.21.4.737-742.

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al, O. V. B. E. 2020, Analysis and research of methods of linearization of the transfer function of precision semiconductor temperature sensors, Vasyl Stefanyk Carpathian National University, available at: https://doi.org/10.15330/pcss.21.4.737-742 [Accessed 5 Aug. 2026].

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Titolo
Analysis and research of methods of linearization of the transfer function of precision semiconductor temperature sensors
Autore / collaboratori
O. V. Boyko et al
Editore
Vasyl Stefanyk Carpathian National University
Anno di pubblicazione
2020
ISSN
1729-4428
ISSN
1729-4428
Lingua
Inglés

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