Influence of growth impurities on thermal defect formation in monocrystalline silicon
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The influence of growth impurities (oxygen and carbon) on the thermalsdefect formation in silicon single crystals has been studied. Annealing was carried out in the temperature range 700-1100°C in steps of 50°C for 5 h...
LCC TENDOlBoeXNpY3M~Idioma eng
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