Edge Absorption of (Y<sub>0.06</sub>Ga<sub>0.94</sub>)<sub>2</sub>O<sub>3</sub> Thin Films
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Fundamental absorption edge of (Y0.06Ga0.94)2O3 thin films, obtained by radio-frequency ion-plasmous sputtering, was investigated using the method of optical spectroscopy. It was established that these films are formed i...
LCC TENDOlBoeXNpY3M~Idioma eng
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