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A New Approach to the Habit Determination of Nano-objects by SEM

K. S. Maksimov et al · SAGE Publishing · 2013

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Author / responsible party
K. S. Maksimov et al
Publisher
SAGE Publishing
Year
2013
ISSN
1847-9804
ISSN
1847-9804
Language
English

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A novel approach to the inspection of nanoparticle habit was proposed in our previous papers. This approach is based on a joint analysis of two scanning electron microscopy (SEM) images corresponding to different convergences of illuminating electron beams. However, increasing convergence worsens an image as the result of spherical aberration. Therefore, for the first time in this paper we describe in detail a new approach which is an alternative to the method of two convergences. It is based on the use of two defocusings which are identical in size, but opposite in signs, thereby. simplifying the demands of SEM.

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APA 7

al, K. S. M. E. (2013). A New Approach to the Habit Determination of Nano-objects by SEM. https://doi.org/10.5772/56746

MLA

al, K. S. Maksimov et. "A New Approach to the Habit Determination of Nano-objects by SEM." 2013. https://doi.org/10.5772/56746.

Chicago

al, K. S. Maksimov et. 2013. "A New Approach to the Habit Determination of Nano-objects by SEM.". https://doi.org/10.5772/56746.

Harvard

al, K. S. M. E. 2013, A New Approach to the Habit Determination of Nano-objects by SEM, SAGE Publishing, available at: https://doi.org/10.5772/56746 [Accessed 5 Aug. 2026].

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Title
A New Approach to the Habit Determination of Nano-objects by SEM
Author / contributors
K. S. Maksimov et al
Publisher
SAGE Publishing
Publication year
2013
ISSN
1847-9804
ISSN
1847-9804
Language
English

Subjects

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Nano‐Object Size; Nano‐Object Shape; Scanning Electron Microscopy; Convergent Illuminating Electron Beams; Defocused Images
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