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Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films

B. S. Dzundza et al · Vasyl Stefanyk Carpathian National University · 2019

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Author / responsible party
B. S. Dzundza et al
Publisher
Vasyl Stefanyk Carpathian National University
Year
2019
ISSN
1729-4428
ISSN
1729-4428
Language
English

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<p class="ArticleAnnotation">A method for measuring the electrical conductivity and photoconductivity of semiconductor films with high electrical resistance is described. An electric circuit is presented and a computer program is developed. That provides automation of measurements, registration and initial processing of data, the possibility of constructing timelines graphs for preliminary analysis of experimental data already in the process of measurement.</p> <p class="ArticleAnnotation"><strong>Key words:</strong> electrical parameters, photoconductivity, automation, microcontroller.</p>

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APA 7

al, B. S. D. E. (2019). Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films. https://doi.org/10.15330/pcss.19.4.363-367

MLA

al, B. S. Dzundza et. "Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films." 2019. https://doi.org/10.15330/pcss.19.4.363-367.

Chicago

al, B. S. Dzundza et. 2019. "Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films.". https://doi.org/10.15330/pcss.19.4.363-367.

Harvard

al, B. S. D. E. 2019, Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films, Vasyl Stefanyk Carpathian National University, available at: https://doi.org/10.15330/pcss.19.4.363-367 [Accessed 5 Aug. 2026].

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Title
Automatization of Measurements of Photoelectric Parameters of High Impedance Semiconductor Films
Author / contributors
B. S. Dzundza et al
Publisher
Vasyl Stefanyk Carpathian National University
Publication year
2019
ISSN
1729-4428
ISSN
1729-4428
Language
English
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