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Heisenberg picture tensor network formalism for optical circuits

Dario Cilluffo et al · American Physical Society · 2026

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Tensor network formalisms have emerged as powerful tools for simulating quantum state evolution. While widely applied in the study of optical quantum circuits, such as boson sampling, existing tensor network approaches fail to address the complexity mismatch between tensor contractions and the calculation of photon-counting probability amplitudes. Here, we present an alternative tensor network framework that exploits the input-output relations of quantum optical circuits encoded in the unitary interferometer matrix. Our approach bridges the complexity gap by enabling the computation of the permanent—central to boson sampling—with the same computational complexity as the best known classical algorithm based on a graphical representation of the operator-basis matrix product states that we introduce. Furthermore, we exploit the flexibility of tensor networks to extend our formalism to incorporate partial distinguishability and photon loss, two key imperfections in practical interferometry experiments. This work offers a significant step forward in the simulation of large-scale quantum optical systems and the understanding of their computational complexity.

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APA 7

al, D. C. E. (2026). Heisenberg picture tensor network formalism for optical circuits. https://doi.org/10.1103/wtwl-979d

MLA

al, Dario Cilluffo et. "Heisenberg picture tensor network formalism for optical circuits." 2026. https://doi.org/10.1103/wtwl-979d.

Chicago

al, Dario Cilluffo et. 2026. "Heisenberg picture tensor network formalism for optical circuits.". https://doi.org/10.1103/wtwl-979d.

Harvard

al, D. C. E. 2026, Heisenberg picture tensor network formalism for optical circuits, American Physical Society, available at: https://doi.org/10.1103/wtwl-979d [Accessed 10 Aug. 2026].

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Title
Heisenberg picture tensor network formalism for optical circuits
Author / contributors
Dario Cilluffo et al
Publisher
American Physical Society
Publication year
2026
ISSN
2643-1564
ISSN
2643-1564
Language
English
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