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Atomically Thin <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"> <mml:msub> <mml:mi>MoS</mml:mi> <mml:mn>2</mml:mn> </mml:msub> </mml:math> : A New Direct-Gap Semiconductor

Kin Fai Mak; Changgu Lee; James Hone; Jie Shan; Tony F. Heinz · Physical Review Letters · 2010

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The electronic properties of ultrathin crystals of molybdenum disulfide consisting of N=1,2,…,6 S-Mo-S monolayers have been investigated by optical spectroscopy. Through characterization by absorption, photoluminescence, and photoconductivity spectroscopy, we trace the effect of quantum confinement on the material's electronic structure. With decreasing thickness, the indirect band gap, which lies below the direct gap in the bulk material, shifts upwards in energy by more than 0.6 eV. This leads to a crossover to a direct-gap material in the limit of the single monolayer. Unlike the bulk material, the MoS₂ monolayer emits light strongly. The freestanding monolayer exhibits an increase in luminescence quantum efficiency by more than a factor of 10⁴ compared with the bulk material.

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APA 7

Mak, K. F, Lee, C, Hone, J, Shan, J, & Heinz, T. F. (2010). Atomically Thin MoS 2: A New Direct-Gap Semiconductor. https://doi.org/10.1103/physrevlett.105.136805

MLA

Mak, Kin Fai, et al. "Atomically Thin MoS 2: A New Direct-Gap Semiconductor." 2010. https://doi.org/10.1103/physrevlett.105.136805.

Chicago

Mak, Kin Fai, Changgu Lee, James Hone, Jie Shan, and Tony F. Heinz. 2010. "Atomically Thin MoS 2: A New Direct-Gap Semiconductor.". https://doi.org/10.1103/physrevlett.105.136805.

Harvard

Mak, K. F. et al. 2010, Atomically Thin MoS 2: A New Direct-Gap Semiconductor, Physical Review Letters, available at: https://doi.org/10.1103/physrevlett.105.136805 [Accessed 10 Aug. 2026].

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Title
Atomically Thin <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"> <mml:msub> <mml:mi>MoS</mml:mi> <mml:mn>2</mml:mn> </mml:msub> </mml:math> : A New Direct-Gap Semiconductor
Author / contributors
Kin Fai Mak; Changgu Lee; James Hone; Jie Shan; Tony F. Heinz
Publisher
Physical Review Letters
Publication year
2010
Language
lv

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