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Atomic Force Microscope

G. Binnig; C. F. Quate; Ch. Gerber · Physical Review Letters · 1986

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Author / responsible party
G. Binnig; C. F. Quate; Ch. Gerber
Publisher
Physical Review Letters
Year
1986
Language
English

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The scanning tunneling microscope is proposed as a method to measure forces as small as ${10}^{\ensuremath{-}18}$ N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30 \AA{}A and a vertical resolution less than 1 \AA{}.

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APA 7

Binnig, G, Quate, C. F, & Gerber, C. (1986). Atomic Force Microscope. https://doi.org/10.1103/physrevlett.56.930

MLA

Binnig, G, et al. "Atomic Force Microscope." 1986. https://doi.org/10.1103/physrevlett.56.930.

Chicago

Binnig, G, C. F. Quate, and Ch. Gerber. 1986. "Atomic Force Microscope.". https://doi.org/10.1103/physrevlett.56.930.

Harvard

Binnig, G, Quate, C. F. and Gerber, C. 1986, Atomic Force Microscope, Physical Review Letters, available at: https://doi.org/10.1103/physrevlett.56.930 [Accessed 8 Aug. 2026].

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Resource details

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Title
Atomic Force Microscope
Author / contributors
G. Binnig; C. F. Quate; Ch. Gerber
Publisher
Physical Review Letters
Publication year
1986
Language
English

Subjects

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Stylus; Microscope; Profilometer; Scanning tunneling microscope; Scanning probe microscopy; Scanning Hall probe microscope; Materials science; Magnetic force microscope; Atomic force microscopy; Resolution (logic); Optics; Conductive atomic force microscopy
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