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Simultaneous Inference in General Parametric Models

Torsten Hothorn; Frank Bretz; Peter H. Westfall · Biometrical Journal · 2008

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Simultaneous inference is a common problem in many areas of application. If multiple null hypotheses are tested simultaneously, the probability of rejecting erroneously at least one of them increases beyond the pre-specified significance level. Simultaneous inference procedures have to be used which adjust for multiplicity and thus control the overall type I error rate. In this paper we describe simultaneous inference procedures in general parametric models, where the experimental questions are specified through a linear combination of elemental model parameters. The framework described here is quite general and extends the canonical theory of multiple comparison procedures in ANOVA models to linear regression problems, generalized linear models, linear mixed effects models, the Cox model, robust linear models, etc. Several examples using a variety of different statistical models illustrate the breadth of the results. For the analyses we use the R add-on package multcomp, which provides a convenient interface to the general approach adopted here.

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APA 7

Hothorn, T, Bretz, F, & Westfall, P. H. (2008). Simultaneous Inference in General Parametric Models. Biometrical Journal. https://doi.org/10.1002/bimj.200810425

MLA

Hothorn, Torsten, et al. Simultaneous Inference in General Parametric Models. Biometrical Journal, 2008. https://doi.org/10.1002/bimj.200810425.

Chicago

Hothorn, Torsten, Frank Bretz, and Peter H. Westfall. 2008. Simultaneous Inference in General Parametric Models. Biometrical Journal. https://doi.org/10.1002/bimj.200810425.

Harvard

Hothorn, T, Bretz, F. and Westfall, P. H. 2008, Simultaneous Inference in General Parametric Models, Biometrical Journal, available at: https://doi.org/10.1002/bimj.200810425 [Accessed 8 Aug. 2026].

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Title
Simultaneous Inference in General Parametric Models
Author / contributors
Torsten Hothorn; Frank Bretz; Peter H. Westfall
Publisher
Biometrical Journal
Publication year
2008
Language
English

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