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Sensitive measurement of optical nonlinearities using a single beam

Mansoor Sheik‐Bahae; A. A. Said; Tai‐Huei Wei; David J. Hagan; Eric W. Van Stryland · IEEE Journal of Quantum Electronics · 1990

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A sensitive single-beam technique for measuring both the nonlinear refractive index and nonlinear absorption coefficient for a wide variety of materials is reported. The authors describe the experimental details and present a comprehensive theoretical analysis including cases where nonlinear refraction is accompanied by nonlinear absorption. In these experiments, the transmittance of a sample is measured through a finite aperture in the far field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinear refraction are easily deduced from such a transmittance curve (Z-scan). Employing this technique, a sensitivity of better than lambda /300 wavefront distortion is achieved in n/sub 2/ measurements of BaF/sub 2/ using picosecond frequency-doubled Nd:YAG laser pulses.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

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APA 7

Sheik‐Bahae, M, Said, A. A, Wei, T, Hagan, D. J, & Stryland, E. W. V. (1990). Sensitive measurement of optical nonlinearities using a single beam. https://doi.org/10.1109/3.53394

MLA

Sheik‐Bahae, Mansoor, et al. "Sensitive measurement of optical nonlinearities using a single beam." 1990. https://doi.org/10.1109/3.53394.

Chicago

Sheik‐Bahae, Mansoor, A. A. Said, Tai‐Huei Wei, David J. Hagan, and Eric W. Van Stryland. 1990. "Sensitive measurement of optical nonlinearities using a single beam.". https://doi.org/10.1109/3.53394.

Harvard

Sheik‐Bahae, M. et al. 1990, Sensitive measurement of optical nonlinearities using a single beam, IEEE Journal of Quantum Electronics, available at: https://doi.org/10.1109/3.53394 [Accessed 8 Aug. 2026].

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Title
Sensitive measurement of optical nonlinearities using a single beam
Author / contributors
Mansoor Sheik‐Bahae; A. A. Said; Tai‐Huei Wei; David J. Hagan; Eric W. Van Stryland
Publisher
IEEE Journal of Quantum Electronics
Publication year
1990
Language
English

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