Sensitive measurement of optical nonlinearities using a single beam
Mansoor Sheik‐Bahae; A. A. Said; Tai‐Huei Wei; David J. Hagan; Eric W. Van Stryland · IEEE Journal of Quantum Electronics · 1990
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APA 7
Sheik‐Bahae, M, Said, A. A, Wei, T, Hagan, D. J, & Stryland, E. W. V. (1990). Sensitive measurement of optical nonlinearities using a single beam. https://doi.org/10.1109/3.53394
MLA
Sheik‐Bahae, Mansoor, et al. "Sensitive measurement of optical nonlinearities using a single beam." 1990. https://doi.org/10.1109/3.53394.
Chicago
Sheik‐Bahae, Mansoor, A. A. Said, Tai‐Huei Wei, David J. Hagan, and Eric W. Van Stryland. 1990. "Sensitive measurement of optical nonlinearities using a single beam.". https://doi.org/10.1109/3.53394.
Harvard
Sheik‐Bahae, M. et al. 1990, Sensitive measurement of optical nonlinearities using a single beam, IEEE Journal of Quantum Electronics, available at: https://doi.org/10.1109/3.53394 [Accessed 8 Aug. 2026].
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- Title
- Sensitive measurement of optical nonlinearities using a single beam
- Author / contributors
- Mansoor Sheik‐Bahae; A. A. Said; Tai‐Huei Wei; David J. Hagan; Eric W. Van Stryland
- Publisher
- IEEE Journal of Quantum Electronics
- Publication year
- 1990
- Language
- English
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