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Characteristic Test Of Transistor Based Multisim Software

Muhammad Ruswandi Djalal et al · Department of Electrical Engineering, Faculty of Engineering, Universitas Khairun · 2019

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Author / responsible party
Muhammad Ruswandi Djalal et al
Publisher
Department of Electrical Engineering, Faculty of Engineering, Universitas Khairun
Year
2019
ISSN
2354-8924
ISSN
2354-8924
Language
English

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Abstract--The purpose of this study is to determine the characteristics of the transistor before it is used in the circuit. Transistors are semiconductor devices used as amplifiers, as circuit breakers and connectors (switching), voltage stabilization, signal modulation or as other functions. Transistor performance can be seen by testing input-output characteristics. Multisim is an electronic capture and schematic simulation program that is part of a series of circuit design programs, together with NI Ultiboard. Multisim can properly simulate electronic components.

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APA 7

al, M. R. D. E. (2019). Characteristic Test Of Transistor Based Multisim Software. https://doi.org/10.33387/protk.v6i2.1214

MLA

al, Muhammad Ruswandi Djalal et. "Characteristic Test Of Transistor Based Multisim Software." 2019. https://doi.org/10.33387/protk.v6i2.1214.

Chicago

al, Muhammad Ruswandi Djalal et. 2019. "Characteristic Test Of Transistor Based Multisim Software.". https://doi.org/10.33387/protk.v6i2.1214.

Harvard

al, M. R. D. E. 2019, Characteristic Test Of Transistor Based Multisim Software, Department of Electrical Engineering, Faculty of Engineering, Universitas Khairun, available at: https://doi.org/10.33387/protk.v6i2.1214 [Accessed 8 Aug. 2026].

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Title
Characteristic Test Of Transistor Based Multisim Software
Author / contributors
Muhammad Ruswandi Djalal et al
Publisher
Department of Electrical Engineering, Faculty of Engineering, Universitas Khairun
Publication year
2019
ISSN
2354-8924
ISSN
2354-8924
Language
English

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keywords : multisim transistor input-output characteristic semiconductor
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