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Squeezed light generation in periodically poled thin-film lithium niobate waveguides

Shi Xiaodong et al · Wiley · 2025

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3-D near-field imaging of guided modes in nanophotonic waveguides

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Squeezed states of light play a key role in quantum-enhanced sensing and continuous-variable quantum information processing. Realizing integrated squeezed light sources is crucial for developing compact and scalable photonic quantum systems. In this work, we demonstrate on-chip broadband vacuum squeezing at telecommunication wavelengths on the thin-film lithium niobate (TFLN) platform. Our device integrates periodically poled lithium niobate (PPLN) nanophotonic waveguides with low-loss edge couplers, comprising bilayer inverse tapers and an SU-8 polymer waveguide. This configuration achieves a fiber-to-chip coupling loss of 1.4 dB and a total homodyne detection loss of 4.0 dB, enabling a measured squeezing level of 1.4 dB. Additional measurements in a more efficient PPLN waveguide (without low-loss couplers) infer an on-chip squeezing level of approximately 10 dB at a pump power of 62 mW. These results underscore the potential of TFLN platform for efficient and scalable squeezed light generation.

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APA 7

al, S. X. E. (2025). Squeezed light generation in periodically poled thin-film lithium niobate waveguides. https://doi.org/10.1515/nanoph-2025-0377

MLA

al, Shi Xiaodong et. "Squeezed light generation in periodically poled thin-film lithium niobate waveguides." 2025. https://doi.org/10.1515/nanoph-2025-0377.

Chicago

al, Shi Xiaodong et. 2025. "Squeezed light generation in periodically poled thin-film lithium niobate waveguides.". https://doi.org/10.1515/nanoph-2025-0377.

Harvard

al, S. X. E. 2025, Squeezed light generation in periodically poled thin-film lithium niobate waveguides, Wiley, available at: https://doi.org/10.1515/nanoph-2025-0377 [Accessed 8 Aug. 2026].

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Title
Squeezed light generation in periodically poled thin-film lithium niobate waveguides
Author / contributors
Shi Xiaodong et al
Publisher
Wiley
Publication year
2025
ISSN
2192-8614
ISSN
2192-8614
Language
English

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