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Crack Growth Rate Model Derived from Domain Knowledge-Guided Symbolic Regression

Shuwei Zhou et al · KeAi Communications Co., Ltd · 2023

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Abstract Machine learning (ML) has powerful nonlinear processing and multivariate learning capabilities, so it has been widely utilised in the fatigue field. However, most ML methods are inexplicable black-box models that are difficult to apply in engineering practice. Symbolic regression (SR) is an interpretable machine learning method for determining the optimal fitting equation for datasets. In this study, domain knowledge-guided SR was used to determine a new fatigue crack growth (FCG) rate model. Three terms of the variable subtree of ΔK, R-ratio, and ΔK th were obtained by analysing eight traditional semi-empirical FCG rate models. Based on the FCG rate test data from other literature, the SR model was constructed using Al-7055-T7511. It was subsequently extended to other alloys (Ti-10V-2Fe-3Al, Ti-6Al-4V, Cr-Mo-V, LC9cs, Al-6013-T651, and Al-2324-T3) using multiple linear regression. Compared with the three semi-empirical FCG rate models, the SR model yielded higher prediction accuracy. This result demonstrates the potential of domain knowledge-guided SR for building the FCG rate model.

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APA 7

al, S. Z. E. (2023). Crack Growth Rate Model Derived from Domain Knowledge-Guided Symbolic Regression. https://doi.org/10.1186/s10033-023-00876-8

MLA

al, Shuwei Zhou et. "Crack Growth Rate Model Derived from Domain Knowledge-Guided Symbolic Regression." 2023. https://doi.org/10.1186/s10033-023-00876-8.

Chicago

al, Shuwei Zhou et. 2023. "Crack Growth Rate Model Derived from Domain Knowledge-Guided Symbolic Regression.". https://doi.org/10.1186/s10033-023-00876-8.

Harvard

al, S. Z. E. 2023, Crack Growth Rate Model Derived from Domain Knowledge-Guided Symbolic Regression, KeAi Communications Co, Ltd, available at: https://doi.org/10.1186/s10033-023-00876-8 [Accessed 7 Aug. 2026].

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Title
Crack Growth Rate Model Derived from Domain Knowledge-Guided Symbolic Regression
Author / contributors
Shuwei Zhou et al
Publisher
KeAi Communications Co., Ltd
Publication year
2023
ISSN
2192-8258
ISSN
2192-8258
Language
English

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