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Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration

Qilong Guan et al · KeAi Communications Co., Ltd · 2023

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Abstract The spacecraft for deep space exploration missions will face extreme environments, including cryogenic temperature, intense radiation, wide-range temperature variations and even the combination of conditions mentioned above. Harsh environments will lead to solder joints degradation or even failure, resulting in damage to onboard electronics. The research activities on high reliability solder joints using in extreme environments can not only reduce the use of onboard protection devices, but effectively improve the overall reliability of spacecraft, which is of great significance to the aviation industry. In this paper, we review the reliability research on SnPb solder alloys, Sn-based lead-free solder alloys and In-based solder alloys in extreme environments, and try to provide some suggestions for the follow-up studies, which focus on solder joint reliability under extreme environments.

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APA 7

al, Q. G. E. (2023). Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration. https://doi.org/10.1186/s10033-023-00834-4

MLA

al, Qilong Guan et. "Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration." 2023. https://doi.org/10.1186/s10033-023-00834-4.

Chicago

al, Qilong Guan et. 2023. "Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration.". https://doi.org/10.1186/s10033-023-00834-4.

Harvard

al, Q. G. E. 2023, Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration, KeAi Communications Co, Ltd, available at: https://doi.org/10.1186/s10033-023-00834-4 [Accessed 8 Aug. 2026].

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Title
Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration
Author / contributors
Qilong Guan et al
Publisher
KeAi Communications Co., Ltd
Publication year
2023
ISSN
2192-8258
ISSN
2192-8258
Language
English

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