Statistical pattern recognition: a review
Anil K. Jain; Peter Duin; Jianchang Mao · IEEE Transactions on Pattern Analysis and Machine Intelligence · 2000
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APA 7
Jain, A. K, Duin, P, & Mao, J. (2000). Statistical pattern recognition: a review. IEEE Transactions on Pattern Analysis and Machine Intelligence. https://doi.org/10.1109/34.824819
MLA
Jain, Anil K, et al. Statistical pattern recognition: a review. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2000. https://doi.org/10.1109/34.824819.
Chicago
Jain, Anil K, Peter Duin, and Jianchang Mao. 2000. Statistical pattern recognition: a review. IEEE Transactions on Pattern Analysis and Machine Intelligence. https://doi.org/10.1109/34.824819.
Harvard
Jain, A. K, Duin, P. and Mao, J. 2000, Statistical pattern recognition: a review, IEEE Transactions on Pattern Analysis and Machine Intelligence, available at: https://doi.org/10.1109/34.824819 [Accessed 6 Aug. 2026].
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- Title
- Statistical pattern recognition: a review
- Author / contributors
- Anil K. Jain; Peter Duin; Jianchang Mao
- Publisher
- IEEE Transactions on Pattern Analysis and Machine Intelligence
- Publication year
- 2000
- Language
- English
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