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Application of modulation spectroscopy for defining band gap of Cd1-xMnxTe solid solution

V.P. Makhniy et al · Vasyl Stefanyk Carpathian National University · 2019

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<p>The modulation spectroscopy was used for defining band gap of monocrystalline Cd<sub>1-x</sub>Mn<sub>x</sub>Te solid solutions, the properties of which vary with molar composition <em>x</em> and the surface preparation quality. It was found that for such samples it is useful to measure differential transmission spectrum , the main peak of which is governed by the composition <em>x</em> and the substrate thickness <em>d</em>. Therefore, it is important to measure <em>E<sub>g</sub></em>(<em>d</em>) for at least three samples of the same composition and different thickness. Using these data, the band gap can be obtained by extrapolating <em>E<sub>g</sub></em>(<em>d</em>) dependence in a logarithmic scale up to intersection with the energy axis at lg <em>d</em> = 0, which corresponds to the sample thickness of 1 μm.</p> <p> </p> <p><strong>Keywords</strong>: semiconductor, band gap, modulation spectroscopy.</p>

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APA 7

al, V. M. E. (2019). Application of modulation spectroscopy for defining band gap of Cd1-xMnxTe solid solution. https://doi.org/10.15330/pcss.20.1.49

MLA

al, V.P. Makhniy et. "Application of modulation spectroscopy for defining band gap of Cd1-xMnxTe solid solution." 2019. https://doi.org/10.15330/pcss.20.1.49.

Chicago

al, V.P. Makhniy et. 2019. "Application of modulation spectroscopy for defining band gap of Cd1-xMnxTe solid solution.". https://doi.org/10.15330/pcss.20.1.49.

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al, V. M. E. 2019, Application of modulation spectroscopy for defining band gap of Cd1-xMnxTe solid solution, Vasyl Stefanyk Carpathian National University, available at: https://doi.org/10.15330/pcss.20.1.49 [Accessed 6 Aug. 2026].

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Title
Application of modulation spectroscopy for defining band gap of Cd1-xMnxTe solid solution
Author / contributors
V.P. Makhniy et al
Publisher
Vasyl Stefanyk Carpathian National University
Publication year
2019
ISSN
1729-4428
ISSN
1729-4428
Language
English

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