Ultra-high resolution strain sensor network assisted with an LS-SVM based hysteresis model
Tao Liu et al · Editorial Office of Opto-Electronic Journals Group, Institute of Optics and Electronics, CAS, China · 2021
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APA 7
al, T. L. E. (2021). Ultra-high resolution strain sensor network assisted with an LS-SVM based hysteresis model. https://doi.org/10.29026/oea.2021.200037
MLA
al, Tao Liu et. "Ultra-high resolution strain sensor network assisted with an LS-SVM based hysteresis model." 2021. https://doi.org/10.29026/oea.2021.200037.
Chicago
al, Tao Liu et. 2021. "Ultra-high resolution strain sensor network assisted with an LS-SVM based hysteresis model.". https://doi.org/10.29026/oea.2021.200037.
Harvard
al, T. L. E. 2021, Ultra-high resolution strain sensor network assisted with an LS-SVM based hysteresis model, Editorial Office of Opto-Electronic Journals Group, Institute of Optics and Electronics, CAS, China, available at: https://doi.org/10.29026/oea.2021.200037 [Accessed 7 Aug. 2026].
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- Title
- Ultra-high resolution strain sensor network assisted with an LS-SVM based hysteresis model
- Author / contributors
- Tao Liu et al
- Publisher
- Editorial Office of Opto-Electronic Journals Group, Institute of Optics and Electronics, CAS, China
- Publication year
- 2021
- ISSN
- 2096-4579
- ISSN
- 2096-4579
- Language
- English
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