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Crystalline Size and Intrinsic Strain of Hexagonal CdTe Thin Films

A.I. Dobrozhan et al · Vasyl Stefanyk Carpathian National University · 2025

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Author / responsible party
A.I. Dobrozhan et al
Publisher
Vasyl Stefanyk Carpathian National University
Year
2025
ISSN
1729-4428
ISSN
1729-4428
Language
English

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In this study, cadmium telluride (CdTe) thin films were synthesized using direct current (DC) magnetron sputtering, and their structural and elastic properties were extensively analyzed. Scanning electron microscopy (SEM) revealed spherical CdTe grains with an average size of approximately 850 nm. X-ray diffraction (XRD) profile analysis, complemented by the Scherrer equation, Scherrer plot, Williamson–Hall (W–H) equations (UDM, USDM, UDEDM), and the Size–Strain Plot (SSP) method, was used to evaluate crystallite size and various elastic properties such as intrinsic strain, microstress, and energy density for different planes respectively. It was observed that crystallite size and intrinsic strain increased with the thickness of the CdTe films, which was attributed to different ionization levels of dissociated Te and Cd atoms at varying sputtering powers.

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APA 7

al, A. D. E. (2025). Crystalline Size and Intrinsic Strain of Hexagonal CdTe Thin Films. https://doi.org/10.15330/pcss.26.2.386-394

MLA

al, A.I. Dobrozhan et. "Crystalline Size and Intrinsic Strain of Hexagonal CdTe Thin Films." 2025. https://doi.org/10.15330/pcss.26.2.386-394.

Chicago

al, A.I. Dobrozhan et. 2025. "Crystalline Size and Intrinsic Strain of Hexagonal CdTe Thin Films.". https://doi.org/10.15330/pcss.26.2.386-394.

Harvard

al, A. D. E. 2025, Crystalline Size and Intrinsic Strain of Hexagonal CdTe Thin Films, Vasyl Stefanyk Carpathian National University, available at: https://doi.org/10.15330/pcss.26.2.386-394 [Accessed 9 Aug. 2026].

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Title
Crystalline Size and Intrinsic Strain of Hexagonal CdTe Thin Films
Author / contributors
A.I. Dobrozhan et al
Publisher
Vasyl Stefanyk Carpathian National University
Publication year
2025
ISSN
1729-4428
ISSN
1729-4428
Language
English

Subjects

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dc magnetron sputtering; elastic properties; cdte thin films; size–strain plot; x-ray diffraction
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