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Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy

Stefan W. Hell; Jan Wichmann · Optics Letters · 1994

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Author / responsible party
Stefan W. Hell; Jan Wichmann
Publisher
Optics Letters
Year
1994
Language
English

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We propose a new type of scanning fluorescence microscope capable of resolving 35 nm in the far field. We overcome the diffraction resolution limit by employing stimulated emission to inhibit the fluorescence process in the outer regions of the excitation point-spread function. In contrast to near-field scanning optical microscopy, this method can produce three-dimensional images of translucent specimens.

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APA 7

Hell, S. W. & Wichmann, J. (1994). Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy. https://doi.org/10.1364/ol.19.000780

MLA

Hell, Stefan W, and Jan Wichmann. "Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy." 1994. https://doi.org/10.1364/ol.19.000780.

Chicago

Hell, Stefan W. and Jan Wichmann. 1994. "Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy.". https://doi.org/10.1364/ol.19.000780.

Harvard

Hell, S. W. and Wichmann, J. 1994, Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy, Optics Letters, available at: https://doi.org/10.1364/ol.19.000780 [Accessed 8 Aug. 2026].

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Title
Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy
Author / contributors
Stefan W. Hell; Jan Wichmann
Publisher
Optics Letters
Publication year
1994
Language
English

Subjects

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Optics; Microscopy; Near-field scanning optical microscope; Point spread function; Fluorescence; Materials science; Diffraction; Resolution (logic); Optical microscope; Fluorescence microscope; Stimulated emission; Photoactivated localization microscopy
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