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Thickness dependence of the martensitic transformation in textured Cu-Al-Ni thin films grown by sputtering on Si (001)

Moran, María Celeste et al · Elsevier · 2019

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Author / responsible party
Moran, María Celeste et al
Publisher
Elsevier
Year
2019
ISSN
2214-7853
ISSN
2214-7853
Language
English

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We study the thickness influence on the martensitic transformation in Cu-Al-Ni thin films grown by sputtering on Si (001). Thin films with thicknesses between 0.1 μm and 2.25 mm were grown at 563 K. The analysis of the microstructure reveals a columnar growth with preferred orientation Cu-Al-Ni L21 (001)[100]//Si (001)[100]. The martensitic transformation is strongly suppressed for films thinner than 1.3mm, which can be related with an interfacial layer imposing restitutive forces. This is evidenced in the extended transformation / retransformation ranges and in the absence of hysteresis for 0.15 μm thick films. Fil: Moran, María Celeste. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; Argentina Fil: Condo, Adriana Maria. Comisión Nacional de Energía Atómica. Centro Atómico Bariloche; Argentina. Comisión Nacional de Energía Atómica. Gerencia del Área de Energía Nuclear. Instituto Balseiro; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina

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APA 7

Moran, M. C. E. A. (2019). Thickness dependence of the martensitic transformation in textured Cu-Al-Ni thin films grown by sputtering on Si (001). http://hdl.handle.net/11336/123254

MLA

Moran, María Celeste et al. "Thickness dependence of the martensitic transformation in textured Cu-Al-Ni thin films grown by sputtering on Si (001)." 2019. http://hdl.handle.net/11336/123254.

Chicago

Moran, María Celeste et al. 2019. "Thickness dependence of the martensitic transformation in textured Cu-Al-Ni thin films grown by sputtering on Si (001).". http://hdl.handle.net/11336/123254.

Harvard

Moran, M. C. E. A. 2019, Thickness dependence of the martensitic transformation in textured Cu-Al-Ni thin films grown by sputtering on Si (001), Elsevier, available at: http://hdl.handle.net/11336/123254 [Accessed 8 Aug. 2026].

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Title
Thickness dependence of the martensitic transformation in textured Cu-Al-Ni thin films grown by sputtering on Si (001)
Author / contributors
Moran, María Celeste et al
Publisher
Elsevier
Publication year
2019
ISSN
2214-7853
ISSN
2214-7853
Language
English

Subjects

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MICROSTRUCTURE; SHAPE MEMORY; THIN FILMS; https://purl.org/becyt/ford/1.3; https://purl.org/becyt/ford/1
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