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In situ charge carrier dynamics of semiconductor nanostructures for advanced photoelectrochemical and photocatalytic applications

Lai Ting-Hsuan et al · Wiley · 2020

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Using in situ ultrafast laser spectroscopic techniques to monitor the charge dynamics of semiconductor photocatalysts under operating conditions is essential for digging out the veritable interactions between charge carriers and the reactive species. This real-time observation is desirable for optimizing individual components and their integration in advanced photoelectrochemical (PEC) and photocatalytic systems, which can achieve the “Holy Grail” of solar energy harvesting and solar fuel generation. This Review summarizes the recent developments of employing transient absorption spectroscopy for in situ measurements of charge dynamics on semiconductor nanostructures. The implications in the PEC and photocatalytic reactions toward hydrogen production and carbon dioxide reduction will be discussed, along with future outlooks and perspectives.

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APA 7

al, L. T. H. E. (2020). In situ charge carrier dynamics of semiconductor nanostructures for advanced photoelectrochemical and photocatalytic applications. https://doi.org/10.1515/nanoph-2020-0472

MLA

al, Lai Ting-Hsuan et. "In situ charge carrier dynamics of semiconductor nanostructures for advanced photoelectrochemical and photocatalytic applications." 2020. https://doi.org/10.1515/nanoph-2020-0472.

Chicago

al, Lai Ting-Hsuan et. 2020. "In situ charge carrier dynamics of semiconductor nanostructures for advanced photoelectrochemical and photocatalytic applications.". https://doi.org/10.1515/nanoph-2020-0472.

Harvard

al, L. T. H. E. 2020, In situ charge carrier dynamics of semiconductor nanostructures for advanced photoelectrochemical and photocatalytic applications, Wiley, available at: https://doi.org/10.1515/nanoph-2020-0472 [Accessed 9 Aug. 2026].

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Title
In situ charge carrier dynamics of semiconductor nanostructures for advanced photoelectrochemical and photocatalytic applications
Author / contributors
Lai Ting-Hsuan et al
Publisher
Wiley
Publication year
2020
ISSN
2192-8606
ISSN
2192-8606
Language
English

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