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Gaptronics: multilevel photonics applications spanning zero-nanometer limits

Jeong Jeeyoon et al · Wiley · 2022

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With recent advances in nanofabrication technology, various metallic gap structures with gap widths reaching a few to sub-nanometer, and even ‘zero-nanometer’, have been realized. At such regime, metallic gaps not only exhibit strong electromagnetic field confinement and enhancement, but also incorporate various quantum phenomena in a macroscopic scale, finding applications in ultrasensitive detection using nanosystems, enhancement of light–matter interactions in low-dimensional materials, and ultralow-power manipulation of electromagnetic waves, etc. Therefore, moving beyond nanometer to ‘zero-nanometer’ can greatly diversify applications of metallic gaps and may open the field of dynamic ‘gaptronics.’ In this paper, an overview is given on wafer-scale metallic gap structures down to zero-nanometer gap width limit. Theoretical description of metallic gaps from sub-10 to zero-nanometer limit, various wafer-scale fabrication methods and their applications are presented. With such versatility and broadband applicability spanning visible to terahertz and even microwaves, the field of ‘gaptronics’ can be a central building block for photochemistry, quantum optical devices, and 5/6G communications.

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APA 7

al, J. J. E. (2022). Gaptronics: multilevel photonics applications spanning zero-nanometer limits. https://doi.org/10.1515/nanoph-2021-0798

MLA

al, Jeong Jeeyoon et. "Gaptronics: multilevel photonics applications spanning zero-nanometer limits." 2022. https://doi.org/10.1515/nanoph-2021-0798.

Chicago

al, Jeong Jeeyoon et. 2022. "Gaptronics: multilevel photonics applications spanning zero-nanometer limits.". https://doi.org/10.1515/nanoph-2021-0798.

Harvard

al, J. J. E. 2022, Gaptronics: multilevel photonics applications spanning zero-nanometer limits, Wiley, available at: https://doi.org/10.1515/nanoph-2021-0798 [Accessed 9 Aug. 2026].

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Title
Gaptronics: multilevel photonics applications spanning zero-nanometer limits
Author / contributors
Jeong Jeeyoon et al
Publisher
Wiley
Publication year
2022
ISSN
2192-8614
ISSN
2192-8614
Language
English

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